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E1
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Group Westphal
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Research
Publications
Journal of Applied Physics 106 , 124906 (2009) Thermal stability of ultra-thin ZrO2 films and structure determination of ZrSi2 islands on Si(100) F. Schönbohm, C. R. Flüchter, T. Lühr, U. Berges, S. Döring [...] 144-147 , 1117-1123 (2005) Determination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(100) interface S. Dreiner, M. Schürmann, M. Krause, U. Berges and C. Westphal Journal [...] C. Westphal, K. Wille Synchrotron Radiation News 16 (2), 9 (2003) Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2×1-reconstructed Si(100) surfaces S. Dreiner, C. Westphal …